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PROJECT DESCRIPTION: The invention is
a simple method to fabricate multiple layers of transistors with one
on top of each other in a 3D structure. Compare with some of the
current practice, the new method is simple, flexible, controllable
and capable to form much better performance transistors. The use of
Metal-Induced Lateral Crystallization with special pattern of Metal
placement results in much better control of the grain location, thus
the transistors can be precisely placed on a single grain. In such,
transistors with single crystal performance can be formed on
polysilicon film with precise control. It solves the problem of poor
performance of transistors formed on polysilicon film. Fabrication
of transistors in 3D can lead to significant area saving and higher
speed of operation, especially when compared with 2D technology.
Unlike existing method to form 3D circuits, the new method provides
flexibility to form not only 2 layers but also multiple layers.
Also, the new invention does not require the use of special
processing technology and is compatible with the current 2D
technology. The invention can potentially provide a technological
breakthrough in the mainstream IC technology to form the next
generation high density, high performance 3D integration circuits.
Also, it allows high performance transistors to be fabricated on top
of any micro structure (such as MEMS). Potential Applications: -
Static RAM (SRAM) - 3D Silicon-on-Insulator (SOI) CMOS -
Micro-electro-mechanical systems (MEMS) Advantages over Present
Technologies: 1. Simple and flexible way to fabricate transistors in
a 3D manner 2. Area saving and higher speed of operation 3. Allow
for multi-layers transistors 4. Allow for high performance
transistors formed on polysilicon film 5. Compatible with current
technology 6. Allow for fabricating high performance transistors on
top of any micro structure (such as MEMS) |
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KEYWORDS: high-performance, data
communication, telecommunication system, phase-locked-loop,
frequency synthes |